Every fault settled on b20 and b22, straight from the published netlists
ITC'99 is the benchmark set test-generation research measures on, published by Politecnico di Torino as .bench netlists. Xerolane read three of its larger circuits exactly as published and produced a full-scan stuck-at test set for each in one run, with the same settings for all three, on the 8 GB laptop.
test coverage, 41,763 faults, every one detected or proven untestable. 1,099 vectors in 169 s.
test coverage, 62,140 faults, every one detected or proven untestable. 1,101 vectors in 191 s.
test coverage, 486,533 faults. 2,301 vectors in 31 minutes.
Netlist to final vector set, one run per design
| Design | Gates | Stuck-at faults | Test coverage | Vectors | Netlist to vectors |
|---|---|---|---|---|---|
| ITC'99 b20 | 20.3K | 41,763 | 100.00% | 1,099 | 169 s |
| ITC'99 b22 | 30.1K | 62,140 | 100.00% | 1,101 | 191 s |
| ITC'99 b19 | 234K | 486,533 | 99.92% | 2,301 | 31 min |
- The published netlist, gate for gateNo resynthesis or remapping, so every fault site is the one in the published file. The netlists are at github.com/cad-polito-it/I99T.
- Full scan, collapsed stuck-at faultsStuck-at-0 and stuck-at-1 on every gate pin, equivalent faults collapsed, every flip-flop on a scan chain.
- Untestable means provenA fault counts as untestable only with a proof that no test for it exists.
- One laptopRTX 4060 with 8 GB, 24 CPU cores, 64 GB RAM. Test generation runs on the CPU, fault simulation on the GPU.
Test coverage is detected faults divided by faults not proven untestable. On b19, 4.2% of the faults are proven untestable, so no tool can reach more than 95.8% fault coverage on it.